Full Wafer Test System
FOX-1P - Aehr Test Systems
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
Topics
- Test Systems
- System Test
- Test
- Wafer
- Systems
- Functional Test Systems
- Production Test Systems
- Memory Test Systems
- Power Supply Test
- Power Test Systems
- Test Probes
- Parametric Test
- Probe Cards
- Test Cards
- Wafer Probes
- Functional Test
- Wafer Probers
- Probe Systems
- Test Pattern
- Unit Testing
- Memory Device
- Data Pattern
- Power Supplies
- PSU
- Probes
- Testing
- Cards
- Polarization Extinction Ratio
- Probers
- Clocks
- Data
- Measurement
- Memory
- Phasor Measurement Units
- Power
- Standards
