Pulsed IV-Curve Solutions
ESDEMC Technology LLC (ESDEMC)
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
Topics
- Current-Voltage
- IV Curve
- Device Under Test
- ESD Test Systems
- System Test
- Test Systems
- ESD Test
- Leakage Current
- Pulse Current
- Sensor Test
- Test Development
- Device Characterization
- Pulse Waveform
- Static Analysis
- Touch Panel
- Current
- Test
- Systems
- Voltage
- Analysis
- Characterization
- Circuit
- Development
- DUT
- EFT
- ESD
- Event
- HBM
- HMM
- IV
- Leakage
- Modules
- Pulse
- TLP
- Transient
- Transmission Line Pulse
- vf-TLP
- VFTLP
- Waveform
