Memory Burn-In Test

The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.

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Topics

Memory
Test
Burn-In
Memory Test Systems
Flash Memory
Board Test
Component Test
Component Testers
System Test
Test Boards